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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/qre/TsaiNPLC19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hoang_Pham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hon_Keung_Tony_Ng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jyun-You_Chiang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tzong-Ru_Tsai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuhlong_Lio>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1002%2Fqre.2503>
foaf:homepage <https://doi.org/10.1002/qre.2503>
dc:identifier DBLP journals/qre/TsaiNPLC19 (xsd:string)
dc:identifier DOI doi.org%2F10.1002%2Fqre.2503 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/qre>
rdfs:label Reliability inference for VGA adapter from dual suppliers based on contaminated type-I interval-censored data. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hoang_Pham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hon_Keung_Tony_Ng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jyun-You_Chiang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tzong-Ru_Tsai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuhlong_Lio>
swrc:number 7 (xsd:string)
swrc:pages 2297-2313 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/qre/TsaiNPLC19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/qre/TsaiNPLC19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/qre/qre35.html#TsaiNPLC19>
rdfs:seeAlso <https://doi.org/10.1002/qre.2503>
dc:title Reliability inference for VGA adapter from dual suppliers based on contaminated type-I interval-censored data. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 35 (xsd:string)