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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/questa/Kumar93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._R._Kumar_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF01158930>
foaf:homepage <https://doi.org/10.1007/BF01158930>
dc:identifier DBLP journals/questa/Kumar93 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF01158930 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/questa>
rdfs:label Re-entrant lines. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._R._Kumar_0001>
swrc:number 1-3 (xsd:string)
swrc:pages 87-110 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/questa/Kumar93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/questa/Kumar93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/questa/questa13.html#Kumar93>
rdfs:seeAlso <https://doi.org/10.1007/BF01158930>
dc:subject Manufacturing systems; semiconductor manufacturing; thin film lines; re-entrant lines; scheduling policies; queueing networks; buffer priority policies; due date policies; stability; stochastic control; mean delay; variance of delay; machine failures; set-up times (xsd:string)
dc:title Re-entrant lines. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 13 (xsd:string)