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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ress/ChenPXL20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ershun_Pan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tangbin_Xia>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yanting_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhen_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.ress.2019.106748>
foaf:homepage <https://doi.org/10.1016/j.ress.2019.106748>
dc:identifier DBLP journals/ress/ChenPXL20 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.ress.2019.106748 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ress>
rdfs:label Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ershun_Pan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tangbin_Xia>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yanting_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhen_Chen>
swrc:pages 106748 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ress/ChenPXL20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ress/ChenPXL20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ress/ress195.html#ChenPXL20>
rdfs:seeAlso <https://doi.org/10.1016/j.ress.2019.106748>
dc:title Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 195 (xsd:string)