Analyzing the value of technology based on the differences of patent citations between applicants and examiners.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/scientometrics/ParkJY17
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/scientometrics/ParkJY17
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Byungun_Yoon
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Inchae_Park
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yujin_Jeong
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2Fs11192-017-2323-0
>
foaf:
homepage
<
https://doi.org/10.1007/s11192-017-2323-0
>
dc:
identifier
DBLP journals/scientometrics/ParkJY17
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1007%2Fs11192-017-2323-0
(xsd:string)
dcterms:
issued
2017
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/scientometrics
>
rdfs:
label
Analyzing the value of technology based on the differences of patent citations between applicants and examiners.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Byungun_Yoon
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Inchae_Park
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yujin_Jeong
>
swrc:
number
2
(xsd:string)
swrc:
pages
665-691
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/scientometrics/ParkJY17/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/scientometrics/ParkJY17
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/scientometrics/scientometrics111.html#ParkJY17
>
rdfs:
seeAlso
<
https://doi.org/10.1007/s11192-017-2323-0
>
dc:
title
Analyzing the value of technology based on the differences of patent citations between applicants and examiners.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
111
(xsd:string)