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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/scientometrics/ParkJY17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Byungun_Yoon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Inchae_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yujin_Jeong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11192-017-2323-0>
foaf:homepage <https://doi.org/10.1007/s11192-017-2323-0>
dc:identifier DBLP journals/scientometrics/ParkJY17 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11192-017-2323-0 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/scientometrics>
rdfs:label Analyzing the value of technology based on the differences of patent citations between applicants and examiners. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Byungun_Yoon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Inchae_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yujin_Jeong>
swrc:number 2 (xsd:string)
swrc:pages 665-691 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/scientometrics/ParkJY17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/scientometrics/ParkJY17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/scientometrics/scientometrics111.html#ParkJY17>
rdfs:seeAlso <https://doi.org/10.1007/s11192-017-2323-0>
dc:title Analyzing the value of technology based on the differences of patent citations between applicants and examiners. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 111 (xsd:string)