Bistable Boron-Related Defect Associated with the Acceptor Removal Process in Irradiated p-Type Silicon - Electronic Properties of Configurational Transformations.
Bistable Boron-Related Defect Associated with the Acceptor Removal Process in Irradiated p-Type Silicon - Electronic Properties of Configurational Transformations.
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Bistable Boron-Related Defect Associated with the Acceptor Removal Process in Irradiated p-Type Silicon - Electronic Properties of Configurational Transformations.
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