[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/sensors/PhamTCP23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Do_Kieu_Trang_Thoi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyohoon_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suhyun_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thi_Tram_Anh_Pham>
foaf:homepage <http://dx.doi.org/doi.org%2F10.3390%2Fs23063246>
foaf:homepage <https://doi.org/10.3390/s23063246>
dc:identifier DBLP journals/sensors/PhamTCP23 (xsd:string)
dc:identifier DOI doi.org%2F10.3390%2Fs23063246 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/sensors>
rdfs:label Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Do_Kieu_Trang_Thoi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyohoon_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Suhyun_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thi_Tram_Anh_Pham>
swrc:month March (xsd:string)
swrc:number 6 (xsd:string)
swrc:pages 3246 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/sensors/PhamTCP23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/sensors/PhamTCP23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/sensors/sensors23.html#PhamTCP23>
rdfs:seeAlso <https://doi.org/10.3390/s23063246>
dc:title Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)