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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/sensors/RenS19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/He_Ren>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-Feng_Sun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.3390%2Fs19245405>
foaf:homepage <https://doi.org/10.3390/s19245405>
dc:identifier DBLP journals/sensors/RenS19 (xsd:string)
dc:identifier DOI doi.org%2F10.3390%2Fs19245405 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/sensors>
rdfs:label Characterizing Dielectric Permittivity of Nanoscale Dielectric Films by Electrostatic Micro-Probe Technology: Finite Element Simulations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/He_Ren>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-Feng_Sun>
swrc:number 24 (xsd:string)
swrc:pages 5405 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/sensors/RenS19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/sensors/RenS19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/sensors/sensors19.html#RenS19>
rdfs:seeAlso <https://doi.org/10.3390/s19245405>
dc:title Characterizing Dielectric Permittivity of Nanoscale Dielectric Films by Electrostatic Micro-Probe Technology: Finite Element Simulations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 19 (xsd:string)