Degradation Monitoring of Insulation Systems Used in Low-Voltage Electromagnetic Coils under Thermal Loading Conditions from a Creep Point of View. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/sensors/WangGXP20>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Aidong_Xu>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Haifeng_Guo>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Kai_Wang_0023>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Michael_G._Pecht>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.3390%2Fs20133696>
foaf:homepage	<https://doi.org/10.3390/s20133696>
dc:identifier	DBLP journals/sensors/WangGXP20 (xsd:string)
dc:identifier	DOI doi.org%2F10.3390%2Fs20133696 (xsd:string)
dcterms:issued	2020 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/sensors>
rdfs:label	Degradation Monitoring of Insulation Systems Used in Low-Voltage Electromagnetic Coils under Thermal Loading Conditions from a Creep Point of View. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Aidong_Xu>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Haifeng_Guo>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Kai_Wang_0023>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Michael_G._Pecht>
swrc:number	13 (xsd:string)
swrc:pages	3696 (xsd:string)
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/sensors/sensors20.html#WangGXP20>
rdfs:seeAlso	<https://doi.org/10.3390/s20133696>
dc:title	Degradation Monitoring of Insulation Systems Used in Low-Voltage Electromagnetic Coils under Thermal Loading Conditions from a Creep Point of View. (xsd:string)
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