Nearest neighbor sampling for better defect prediction.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/sigsoft/Boetticher05
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dcterms:
bibliographicCitation
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http://dblp.uni-trier.de/rec/bibtex/journals/sigsoft/Boetticher05
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dc:
creator
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https://dblp.l3s.de/d2r/resource/authors/Gary_D._Boetticher
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foaf:
homepage
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http://dx.doi.org/doi.org%2F10.1145%2F1082983.1083173
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DBLP journals/sigsoft/Boetticher05
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dc:
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dcterms:
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2005
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swrc:
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rdfs:
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Nearest neighbor sampling for better defect prediction.
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https://dblp.l3s.de/d2r/resource/authors/Gary_D._Boetticher
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4
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1-6
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rdfs:
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http://dblp.uni-trier.de/db/journals/sigsoft/sigsoft30.html#Boetticher05
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rdfs:
seeAlso
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https://doi.org/10.1145/1082983.1083173
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dc:
subject
NASA data repository, decision trees, defect prediction, empirical software engineering, nearest neighbor analysis
(xsd:string)
dc:
title
Nearest neighbor sampling for better defect prediction.
(xsd:string)
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