Requirements traceability in automated test generation: application to smart card software validation.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/sigsoft/BouquetJLPU05
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/sigsoft/BouquetJLPU05
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bruno_Legeard
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Eddie_Jaffuel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fabien_Peureux
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fabrice_Bouquet
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mark_Utting
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1145%2F1082983.1083282
>
foaf:
homepage
<
https://doi.org/10.1145/1082983.1083282
>
dc:
identifier
DBLP journals/sigsoft/BouquetJLPU05
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1145%2F1082983.1083282
(xsd:string)
dcterms:
issued
2005
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/sigsoft
>
rdfs:
label
Requirements traceability in automated test generation: application to smart card software validation.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bruno_Legeard
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Eddie_Jaffuel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fabien_Peureux
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fabrice_Bouquet
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mark_Utting
>
swrc:
number
4
(xsd:string)
swrc:
pages
1-7
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/sigsoft/BouquetJLPU05/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/sigsoft/BouquetJLPU05
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/sigsoft/sigsoft30.html#BouquetJLPU05
>
rdfs:
seeAlso
<
https://doi.org/10.1145/1082983.1083282
>
dc:
subject
formal model, model-based testing, requirements traceability
(xsd:string)
dc:
title
Requirements traceability in automated test generation: application to smart card software validation.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
30
(xsd:string)