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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/spl/ChenLZ23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bin_Li_0011>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jinhua_Zeng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tong_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FLSP.2023.3245947>
foaf:homepage <https://doi.org/10.1109/LSP.2023.3245947>
dc:identifier DBLP journals/spl/ChenLZ23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FLSP.2023.3245947 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/spl>
rdfs:label Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly Detection With ViT-VAE. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bin_Li_0011>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jinhua_Zeng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tong_Chen>
swrc:pages 150-154 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/spl/ChenLZ23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/spl/ChenLZ23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/spl/spl30.html#ChenLZ23>
rdfs:seeAlso <https://doi.org/10.1109/LSP.2023.3245947>
dc:title Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly Detection With ViT-VAE. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 30 (xsd:string)