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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/systems/VuCK24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haejoong_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tai-Woo_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thi-Thu-Huyen_Vu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.3390%2Fsystems12010024>
foaf:homepage <https://doi.org/10.3390/systems12010024>
dc:identifier DBLP journals/systems/VuCK24 (xsd:string)
dc:identifier DOI doi.org%2F10.3390%2Fsystems12010024 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/systems>
rdfs:label Enhancing Quality Control in Battery Component Manufacturing: Deep Learning-Based Approaches for Defect Detection on Microfasteners. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haejoong_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tai-Woo_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thi-Thu-Huyen_Vu>
swrc:number 1 (xsd:string)
swrc:pages 24 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/systems/VuCK24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/systems/VuCK24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/systems/systems12.html#VuCK24>
rdfs:seeAlso <https://doi.org/10.3390/systems12010024>
dc:title Enhancing Quality Control in Battery Component Manufacturing: Deep Learning-Based Approaches for Defect Detection on Microfasteners. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 12 (xsd:string)