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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tbcas/SenevirathnaLDS19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bathiya_Senevirathna>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elisabeth_Smela>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marc_Dandin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pamela_Abshire>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sheung_Lu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTBCAS.2019.2926836>
foaf:homepage <https://doi.org/10.1109/TBCAS.2019.2926836>
dc:identifier DBLP journals/tbcas/SenevirathnaLDS19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTBCAS.2019.2926836 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tbcas>
rdfs:label Correlation of Capacitance and Microscopy Measurements Using Image Processing for a Lab-on-CMOS Microsystem. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bathiya_Senevirathna>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elisabeth_Smela>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marc_Dandin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pamela_Abshire>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sheung_Lu>
swrc:number 6 (xsd:string)
swrc:pages 1214-1225 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tbcas/SenevirathnaLDS19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tbcas/SenevirathnaLDS19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tbcas/tbcas13.html#SenevirathnaLDS19>
rdfs:seeAlso <https://doi.org/10.1109/TBCAS.2019.2926836>
dc:title Correlation of Capacitance and Microscopy Measurements Using Image Processing for a Lab-on-CMOS Microsystem. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 13 (xsd:string)