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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/AgarwalF81>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andy_S._F._Fung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vinod_K._Agarwal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.1981.1675716>
foaf:homepage <https://doi.org/10.1109/TC.1981.1675716>
dc:identifier DBLP journals/tc/AgarwalF81 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.1981.1675716 (xsd:string)
dcterms:issued 1981 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Multiple Fault Testing of Large Circuits by Single Fault Test Sets. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andy_S._F._Fung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vinod_K._Agarwal>
swrc:number 11 (xsd:string)
swrc:pages 855-865 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/AgarwalF81/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/AgarwalF81>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc30.html#AgarwalF81>
rdfs:seeAlso <https://doi.org/10.1109/TC.1981.1675716>
dc:title Multiple Fault Testing of Large Circuits by Single Fault Test Sets. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 30 (xsd:string)