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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/AliR94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G._Robert_Redinbo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._A._Ali>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.338103>
foaf:homepage <https://doi.org/10.1109/12.338103>
dc:identifier DBLP journals/tc/AliR94 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.338103 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G._Robert_Redinbo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._A._Ali>
swrc:number 12 (xsd:string)
swrc:pages 1426-1428 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/AliR94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/AliR94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc43.html#AliR94>
rdfs:seeAlso <https://doi.org/10.1109/12.338103>
dc:subject combinational circuits; fault diagnosis; logic testing; tight lower bounds; detection probabilities; single faults; internal signal lines; combinational circuits; random testing. (xsd:string)
dc:title Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 43 (xsd:string)