Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/AliR94
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/AliR94
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/G._Robert_Redinbo
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/S._A._Ali
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F12.338103
>
foaf:
homepage
<
https://doi.org/10.1109/12.338103
>
dc:
identifier
DBLP journals/tc/AliR94
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F12.338103
(xsd:string)
dcterms:
issued
1994
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tc
>
rdfs:
label
Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/G._Robert_Redinbo
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/S._A._Ali
>
swrc:
number
12
(xsd:string)
swrc:
pages
1426-1428
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tc/AliR94/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tc/AliR94
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tc/tc43.html#AliR94
>
rdfs:
seeAlso
<
https://doi.org/10.1109/12.338103
>
dc:
subject
combinational circuits; fault diagnosis; logic testing; tight lower bounds; detection probabilities; single faults; internal signal lines; combinational circuits; random testing.
(xsd:string)
dc:
title
Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
43
(xsd:string)