[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/BarzilaiCR83>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arnold_L._Rosenberg>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Don_Coppersmith>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zeev_Barzilai>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.1983.1676202>
foaf:homepage <https://doi.org/10.1109/TC.1983.1676202>
dc:identifier DBLP journals/tc/BarzilaiCR83 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.1983.1676202 (xsd:string)
dcterms:issued 1983 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arnold_L._Rosenberg>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Don_Coppersmith>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zeev_Barzilai>
swrc:number 2 (xsd:string)
swrc:pages 190-194 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/BarzilaiCR83/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/BarzilaiCR83>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc32.html#BarzilaiCR83>
rdfs:seeAlso <https://doi.org/10.1109/TC.1983.1676202>
dc:subject VLSI self-testing, Linear feedback shift registers (LFSR), primitive polynomials (xsd:string)
dc:title Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 32 (xsd:string)