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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/BayraktarogluO03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alex_Orailoglu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ismet_Bayraktaroglu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.2003.1244945>
foaf:homepage <https://doi.org/10.1109/TC.2003.1244945>
dc:identifier DBLP journals/tc/BayraktarogluO03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.2003.1244945 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Concurrent Application of Compaction and Compression for Test Time and Data Volume Reduction in Scan Designs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alex_Orailoglu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ismet_Bayraktaroglu>
swrc:number 11 (xsd:string)
swrc:pages 1480-1489 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/BayraktarogluO03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/BayraktarogluO03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc52.html#BayraktarogluO03>
rdfs:seeAlso <https://doi.org/10.1109/TC.2003.1244945>
dc:subject Test pattern compression, test pattern compaction, scan chains, on-chip decompression, deterministic decompression. (xsd:string)
dc:title Concurrent Application of Compaction and Compression for Test Time and Data Volume Reduction in Scan Designs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 52 (xsd:string)