Efficient Testing of Optimal Time Adders. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/tc/Becker88>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2F12.2262>
foaf:homepage	<https://doi.org/10.1109/12.2262>
dc:identifier	DBLP journals/tc/Becker88 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2F12.2262 (xsd:string)
dcterms:issued	1988 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label	Efficient Testing of Optimal Time Adders. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
swrc:number	9 (xsd:string)
swrc:pages	1113-1121 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/tc/Becker88/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/tc/Becker88>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/tc/tc37.html#Becker88>
rdfs:seeAlso	<https://doi.org/10.1109/12.2262>
dc:subject	optimal time adders; carry look-ahead adder; conditional sum adder; VLSI chip; adders; integrated logic circuits; logic testing; VLSI. (xsd:string)
dc:title	Efficient Testing of Optimal Time Adders. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	37 (xsd:string)