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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/BenowitzCABJ75>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carl_T._Joeckel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donald_F._Calhoun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gary_E._Alderson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_E._Bauer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Norman_Benowitz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FT-C.1975.224251>
foaf:homepage <https://doi.org/10.1109/T-C.1975.224251>
dc:identifier DBLP journals/tc/BenowitzCABJ75 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FT-C.1975.224251 (xsd:string)
dcterms:issued 1975 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label An Advanced Fault Isolation System for Digital Logic. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carl_T._Joeckel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donald_F._Calhoun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gary_E._Alderson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_E._Bauer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Norman_Benowitz>
swrc:number 5 (xsd:string)
swrc:pages 489-497 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/BenowitzCABJ75/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/BenowitzCABJ75>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc24.html#BenowitzCABJ75>
rdfs:seeAlso <https://doi.org/10.1109/T-C.1975.224251>
dc:subject Automatic test equipment (ATE), built-in test (BIT), fault isolation, large-scale integration (LSI) testing, self test, subsystem test, system maintenance, test response. (xsd:string)
dc:title An Advanced Fault Isolation System for Digital Logic. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)