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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/BhattacharyaAA95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Debashis_Bhattacharya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Prathima_Agrawal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.372035>
foaf:homepage <https://doi.org/10.1109/12.372035>
dc:identifier DBLP journals/tc/BhattacharyaAA95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.372035 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Test Generation for Path Delay Faults Using Binary Decision Diagrams. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Debashis_Bhattacharya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Prathima_Agrawal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:number 3 (xsd:string)
swrc:pages 434-447 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/BhattacharyaAA95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/BhattacharyaAA95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc44.html#BhattacharyaAA95>
rdfs:seeAlso <https://doi.org/10.1109/12.372035>
dc:subject Boolean algebraic test generation, binary decision diagrams, delay faults, redundant delay faults, robust delay tests, scan testing of delay faults. (xsd:string)
dc:title Test Generation for Path Delay Faults Using Binary Decision Diagrams. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 44 (xsd:string)