[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/BlaumGM88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mario_Blaum>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_J._McEliece>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rodney_M._Goodman>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.75143>
foaf:homepage <https://doi.org/10.1109/12.75143>
dc:identifier DBLP journals/tc/BlaumGM88 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.75143 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label The Reliability of Single-Error Protected Computer Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mario_Blaum>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_J._McEliece>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rodney_M._Goodman>
swrc:number 1 (xsd:string)
swrc:pages 114-119 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/BlaumGM88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/BlaumGM88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc37.html#BlaumGM88>
rdfs:seeAlso <https://doi.org/10.1109/12.75143>
dc:subject single-error correcting double-error detecting codes; SEC-DED codes; reliability; single-error protected computer memories; lifetimes; memory chip failure; Poisson assumption; closed-form expression; mean time to failure; circuit reliability; error correction codes; error detection codes; life testing; semiconductor storage; statistical analysis. (xsd:string)
dc:title The Reliability of Single-Error Protected Computer Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)