Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/ChenD86
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https://dblp.l3s.de/d2r/resource/authors/Min-Wen_Du
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http://dx.doi.org/doi.org%2F10.1109%2FTC.1986.1676714
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1986
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Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits.
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1068-1071
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dc:
subject
universal test set, Bin packing problem, linear circuit, multivalued logic, stuck-fault detection/location
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title
Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits.
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