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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/ChenG96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Ang_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.485565>
foaf:homepage <https://doi.org/10.1109/12.485565>
dc:identifier DBLP journals/tc/ChenG96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.485565 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label BIST Test Pattern Generators for Two-Pattern Testing-Theory and Design Algorithms. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Ang_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
swrc:number 3 (xsd:string)
swrc:pages 257-269 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/ChenG96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/ChenG96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc45.html#ChenG96>
rdfs:seeAlso <https://doi.org/10.1109/12.485565>
dc:subject Built-in self-test, test pattern generator, pseudo-exhaustive testing, two-pattern testing, linear feedback shift register, cellular automata. (xsd:string)
dc:title BIST Test Pattern Generators for Two-Pattern Testing-Theory and Design Algorithms. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 45 (xsd:string)