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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/ChinN05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_Chin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mehrdad_Nourani>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.2005.196>
foaf:homepage <https://doi.org/10.1109/TC.2005.196>
dc:identifier DBLP journals/tc/ChinN05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.2005.196 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label FITS: An Integrated ILP-Based Test Scheduling Environment. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_Chin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mehrdad_Nourani>
swrc:number 12 (xsd:string)
swrc:pages 1598-1613 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/ChinN05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/ChinN05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc54.html#ChinN05>
rdfs:seeAlso <https://doi.org/10.1109/TC.2005.196>
dc:subject Automatic test equipment, embedded core, grid, hot-spot, ILP formulation, power profile, system-on-chip, trade-off, test access mechanism, test schedule. (xsd:string)
dc:title FITS: An Integrated ILP-Based Test Scheduling Environment. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 54 (xsd:string)