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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/Damarla92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thyagaraju_R._Damarla>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.165392>
foaf:homepage <https://doi.org/10.1109/12.165392>
dc:identifier DBLP journals/tc/Damarla92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.165392 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Generalized Transforms for Multiple Valued Circuits and Their Fault Detection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thyagaraju_R._Damarla>
swrc:number 9 (xsd:string)
swrc:pages 1101-1109 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/Damarla92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/Damarla92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc41.html#Damarla92>
rdfs:seeAlso <https://doi.org/10.1109/12.165392>
dc:subject generalised transforms; simple transforms; multiple valued functions; multiple value network; stuck at faults; test set generation; multiple valued circuits; fault detection; canonical representation; radix; spectral coefficients; test patterns; bridging faults; upper bound; fault location; logic circuits; many-valued logics; transforms; VLSI. (xsd:string)
dc:title Generalized Transforms for Multiple Valued Circuits and Their Fault Detection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 41 (xsd:string)