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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/DavidFC89>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antoine_Fuentes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernard_Courtois>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ren%E2%88%9A%C2%A9_David>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.24267>
foaf:homepage <https://doi.org/10.1109/12.24267>
dc:identifier DBLP journals/tc/DavidFC89 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.24267 (xsd:string)
dcterms:issued 1989 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Random Pattern Testing Versus Deterministic Testing of RAM's. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antoine_Fuentes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernard_Courtois>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ren%E2%88%9A%C2%A9_David>
swrc:number 5 (xsd:string)
swrc:pages 637-650 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/DavidFC89/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/DavidFC89>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc38.html#DavidFC89>
rdfs:seeAlso <https://doi.org/10.1109/12.24267>
dc:subject random pattern testing; single faults; double faults; deterministic testing; RAMs; random-access memories; classical fault models; pattern-sensitive faults; Markov chains; parameters; multiple-coupling faults; test patterns; integrated circuit testing; Markov processes; random-access storage. (xsd:string)
dc:title Random Pattern Testing Versus Deterministic Testing of RAM's. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 38 (xsd:string)