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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/Etiemble80>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Etiemble>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.1980.1675616>
foaf:homepage <https://doi.org/10.1109/TC.1980.1675616>
dc:identifier DBLP journals/tc/Etiemble80 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.1980.1675616 (xsd:string)
dcterms:issued 1980 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Multivalued I2L Circuits for TSC Checkers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Etiemble>
swrc:number 6 (xsd:string)
swrc:pages 537-540 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/Etiemble80/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/Etiemble80>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc29.html#Etiemble80>
rdfs:seeAlso <https://doi.org/10.1109/TC.1980.1675616>
dc:subject totally self-checking comparator, Error-detecting codes, I, multivalued logic, totally self-checking checkers (xsd:string)
dc:title Multivalued I2L Circuits for TSC Checkers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 29 (xsd:string)