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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/FerrandiFS02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donatella_Sciuto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Ferrandi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Franco_Fummi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.980008>
foaf:homepage <https://doi.org/10.1109/12.980008>
dc:identifier DBLP journals/tc/FerrandiFS02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.980008 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Test Generation and Testability Alternatives Exploration of Critical Algorithms for Embedded Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donatella_Sciuto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Ferrandi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Franco_Fummi>
swrc:number 2 (xsd:string)
swrc:pages 200-215 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/FerrandiFS02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/FerrandiFS02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc51.html#FerrandiFS02>
rdfs:seeAlso <https://doi.org/10.1109/12.980008>
dc:subject Testing of embedded systems, ATPG, fault modeling, testability analysis, VHDL. (xsd:string)
dc:title Test Generation and Testability Alternatives Exploration of Critical Algorithms for Embedded Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)