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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/FujaH86>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chris_Heegard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_E._Fuja>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.1986.1676701>
foaf:homepage <https://doi.org/10.1109/TC.1986.1676701>
dc:identifier DBLP journals/tc/FujaH86 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.1986.1676701 (xsd:string)
dcterms:issued 1986 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM's. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chris_Heegard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_E._Fuja>
swrc:number 11 (xsd:string)
swrc:pages 996-1000 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/FujaH86/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/FujaH86>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc35.html#FujaH86>
rdfs:seeAlso <https://doi.org/10.1109/TC.1986.1676701>
dc:subject yield improvement, Error-control coding, hard defects, RAM's, redundancy, reliability, row/column replacement (xsd:string)
dc:title Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM's. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 35 (xsd:string)