[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/FujiwaraK81>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.1981.1675712>
foaf:homepage <https://doi.org/10.1109/TC.1981.1675712>
dc:identifier DBLP journals/tc/FujiwaraK81 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.1981.1675712 (xsd:string)
dcterms:issued 1981 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label A Design of Programmable Logic Arrays with Universal Tests. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
swrc:number 11 (xsd:string)
swrc:pages 823-828 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/FujiwaraK81/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/FujiwaraK81>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc30.html#FujiwaraK81>
rdfs:seeAlso <https://doi.org/10.1109/TC.1981.1675712>
dc:subject universal test sets, Easily testable design, fault detection, fault location, logic circuits, programmable logic arrays (PLA's) (xsd:string)
dc:title A Design of Programmable Logic Arrays with Universal Tests. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 30 (xsd:string)