Pseudoexhaustive Test Pattern Generator with Enhanced Fault Coverage.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/GolanNH88
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Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/GolanNH88
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jan_Hlavicka
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ondrej_Nov%E2%88%9A%C2%B0k
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/P._Golan
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F12.2198
>
foaf:
homepage
<
https://doi.org/10.1109/12.2198
>
dc:
identifier
DBLP journals/tc/GolanNH88
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F12.2198
(xsd:string)
dcterms:
issued
1988
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tc
>
rdfs:
label
Pseudoexhaustive Test Pattern Generator with Enhanced Fault Coverage.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jan_Hlavicka
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ondrej_Nov%E2%88%9A%C2%B0k
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/P._Golan
>
swrc:
number
4
(xsd:string)
swrc:
pages
496-500
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tc/GolanNH88/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tc/GolanNH88
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tc/tc37.html#GolanNH88
>
rdfs:
seeAlso
<
https://doi.org/10.1109/12.2198
>
dc:
subject
pseudoexhaustive test pattern generation; random access scan; linear feedback shift registers; scan addresses; feedback; integrated circuit testing; logic testing; shift registers.
(xsd:string)
dc:
title
Pseudoexhaustive Test Pattern Generator with Enhanced Fault Coverage.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
37
(xsd:string)