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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/HellebrandRTVC95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernard_Courtois>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srikanth_Venkataraman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steffen_Tarnick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sybille_Hellebrand>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.364534>
foaf:homepage <https://doi.org/10.1109/12.364534>
dc:identifier DBLP journals/tc/HellebrandRTVC95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.364534 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernard_Courtois>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srikanth_Venkataraman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steffen_Tarnick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sybille_Hellebrand>
swrc:number 2 (xsd:string)
swrc:pages 223-233 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/HellebrandRTVC95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/HellebrandRTVC95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc44.html#HellebrandRTVC95>
rdfs:seeAlso <https://doi.org/10.1109/12.364534>
dc:title Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 44 (xsd:string)