Fast Static Compaction Algorithms for Sequential Circuit Test Vectors.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/HsiaoRP99
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DBLP journals/tc/HsiaoRP99
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1999
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Fast Static Compaction Algorithms for Sequential Circuit Test Vectors.
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3
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311-322
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dc:
subject
Static test set compaction, test generation, recurrence subsequence, fault simulation.
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Fast Static Compaction Algorithms for Sequential Circuit Test Vectors.
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48
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