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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/HsuG96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuan-Chieh_Hsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.544489>
foaf:homepage <https://doi.org/10.1109/12.544489>
dc:identifier DBLP journals/tc/HsuG96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.544489 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label A Simulator for At-Speed Robust Testing of Path Delay Faults in Combinational Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuan-Chieh_Hsu>
swrc:number 11 (xsd:string)
swrc:pages 1312-1318 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/HsuG96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/HsuG96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc45.html#HsuG96>
rdfs:seeAlso <https://doi.org/10.1109/12.544489>
dc:subject Delay testing, robust path delay testing, at-speed delay testing, fault simulation. (xsd:string)
dc:title A Simulator for At-Speed Robust Testing of Path Delay Faults in Combinational Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 45 (xsd:string)