Aliasing Error for a Mask ROM Built-In Self-Test.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/IwasakiN96
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https://dblp.l3s.de/d2r/resource/authors/Shigeo_Nakamura
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1996
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Aliasing Error for a Mask ROM Built-In Self-Test.
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3
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270-277
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dc:
subject
Built-in self-test, mask ROM, experimental faults analysis, aliasing probability, MISRs.
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dc:
title
Aliasing Error for a Mask ROM Built-In Self-Test.
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45
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