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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/IwasakiN96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuhiko_Iwasaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shigeo_Nakamura>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.485566>
foaf:homepage <https://doi.org/10.1109/12.485566>
dc:identifier DBLP journals/tc/IwasakiN96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.485566 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Aliasing Error for a Mask ROM Built-In Self-Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuhiko_Iwasaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shigeo_Nakamura>
swrc:number 3 (xsd:string)
swrc:pages 270-277 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/IwasakiN96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/IwasakiN96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc45.html#IwasakiN96>
rdfs:seeAlso <https://doi.org/10.1109/12.485566>
dc:subject Built-in self-test, mask ROM, experimental faults analysis, aliasing probability, MISRs. (xsd:string)
dc:title Aliasing Error for a Mask ROM Built-In Self-Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 45 (xsd:string)