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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/JarwalaP88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dhiraj_K._Pradhan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Najmi_T._Jarwala>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.5985>
foaf:homepage <https://doi.org/10.1109/12.5985>
dc:identifier DBLP journals/tc/JarwalaP88 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.5985 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label TRAM: A Design Methodology for High-Performance, Easily Testable, Multimegabit RAM's. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dhiraj_K._Pradhan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Najmi_T._Jarwala>
swrc:number 10 (xsd:string)
swrc:pages 1235-1250 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/JarwalaP88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/JarwalaP88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc37.html#JarwalaP88>
rdfs:seeAlso <https://doi.org/10.1109/12.5985>
dc:subject TRAM; design methodology; high-performance; multimegabit dynamic RAMs; testability; performance; yield; reliability; integrated memory circuits; random-access storage. (xsd:string)
dc:title TRAM: A Design Methodology for High-Performance, Easily Testable, Multimegabit RAM's. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)