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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/JongG88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Petra_De_Jong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.8710>
foaf:homepage <https://doi.org/10.1109/12.8710>
dc:identifier DBLP journals/tc/JongG88 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.8710 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Test Pattern Generation for API Faults in RAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Petra_De_Jong>
swrc:number 11 (xsd:string)
swrc:pages 1426-1428 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/JongG88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/JongG88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc37.html#JongG88>
rdfs:seeAlso <https://doi.org/10.1109/12.8710>
dc:subject test pattern generation; BIST; Hamiltonian paths; API faults; RAM; pattern-sensitive faults; near optimal WRITE sequence; automatic testing; fault location; integrated circuit testing; integrated memory circuits; random-access storage. (xsd:string)
dc:title Test Pattern Generation for API Faults in RAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)