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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/KapurM92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Ray_Mercer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rohit_Kapur>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.214666>
foaf:homepage <https://doi.org/10.1109/12.214666>
dc:identifier DBLP journals/tc/KapurM92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.214666 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Ray_Mercer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rohit_Kapur>
swrc:number 12 (xsd:string)
swrc:pages 1580-1588 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/KapurM92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/KapurM92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc41.html#KapurM92>
rdfs:seeAlso <https://doi.org/10.1109/12.214666>
dc:subject bounding algorithm; circuit faults; signal probabilities; testability measurement; conditional syndromes; random pattern testability; auxiliary gate; lower bounds; pseudorandom pattern resistant faults; circuit structure; built-in self test; circuit analysis computing; computational complexity; integrated circuit testing. (xsd:string)
dc:title Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 41 (xsd:string)