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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/KarkouriACV94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alain_Verreault>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eduard_Cerny>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/El_Mostapha_Aboulhamid>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youn%E2%88%9A%C2%AEs_Karkouri>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.250613>
foaf:homepage <https://doi.org/10.1109/12.250613>
dc:identifier DBLP journals/tc/KarkouriACV94 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.250613 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Use of Fault Dropping for Multiple Fault Analysis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alain_Verreault>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eduard_Cerny>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/El_Mostapha_Aboulhamid>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youn%E2%88%9A%C2%AEs_Karkouri>
swrc:number 1 (xsd:string)
swrc:pages 98-103 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/KarkouriACV94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/KarkouriACV94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc43.html#KarkouriACV94>
rdfs:seeAlso <https://doi.org/10.1109/12.250613>
dc:subject logic circuits; logic testing; combinatorial circuits; fault dropping; multiple fault analysis; gate level; multiple stuck at faults; frontier faults; fault-free circuit; benchmark circuits; fault collapsing; logic circuits; stuck at faults. (xsd:string)
dc:title Use of Fault Dropping for Multiple Fault Analysis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 43 (xsd:string)