Design of Self-Diagnostic Boards by Multiple Signature Analysis.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/KarpovskyC93
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/KarpovskyC93
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Mark_G._Karpovsky
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dc:
creator
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https://dblp.l3s.de/d2r/resource/authors/Saeed_M._Chaudhry
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foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F12.241593
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dc:
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DBLP journals/tc/KarpovskyC93
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dc:
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DOI doi.org%2F10.1109%2F12.241593
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dcterms:
issued
1993
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rdfs:
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Design of Self-Diagnostic Boards by Multiple Signature Analysis.
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<
https://dblp.l3s.de/d2r/resource/authors/Mark_G._Karpovsky
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https://dblp.l3s.de/d2r/resource/authors/Saeed_M._Chaudhry
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swrc:
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9
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swrc:
pages
1035-1044
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rdfs:
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rdfs:
seeAlso
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https://doi.org/10.1109/12.241593
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dc:
subject
self-diagnostic boards; multiple signature analysis; test responses; multiple error-correcting codes; faulty chips; faulty boards; multiprocessor environment; diagnostics; error correction codes; logic testing; Reed-Solomon codes.
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dc:
title
Design of Self-Diagnostic Boards by Multiple Signature Analysis.
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42
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