Optimal Robust Compression of Test Responses.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/KarpovxkyN90
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dcterms:
bibliographicCitation
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http://dblp.uni-trier.de/rec/bibtex/journals/tc/KarpovxkyN90
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Mark_G._Karpovsky
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dc:
creator
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https://dblp.l3s.de/d2r/resource/authors/Prawat_Nagvajara
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homepage
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http://dx.doi.org/doi.org%2F10.1109%2F12.46290
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DBLP journals/tc/KarpovxkyN90
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issued
1990
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Optimal Robust Compression of Test Responses.
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1
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swrc:
pages
138-141
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dc:
subject
optimal robust compression; test responses; built-in self-test; VLSI design; statistics; fault-free responses; pseudorandom testing; error detectability; automatic testing; data compression; integrated circuit testing; logic testing; VLSI.
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dc:
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Optimal Robust Compression of Test Responses.
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39
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