Modeling the Effect of Redundancy on Yield and Performance of VLSI Systems.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/KorenP87
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1987
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Modeling the Effect of Redundancy on Yield and Performance of VLSI Systems.
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344-355
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dc:
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yield, Computational availability, fault tolerance, redundancy, reliability, VLSI designs, wafer-scale integration
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Modeling the Effect of Redundancy on Yield and Performance of VLSI Systems.
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