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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/LarssonP06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Larsson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zebo_Peng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.2006.28>
foaf:homepage <https://doi.org/10.1109/TC.2006.28>
dc:identifier DBLP journals/tc/LarssonP06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.2006.28 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Power-Aware Test Planning in the Early System-on-Chip Design Exploration Process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Larsson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zebo_Peng>
swrc:number 2 (xsd:string)
swrc:pages 227-239 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/LarssonP06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/LarssonP06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc55.html#LarssonP06>
rdfs:seeAlso <https://doi.org/10.1109/TC.2006.28>
dc:subject Test scheduling, test set selection, design exploration, TAM design, power consumption, hot-spots. (xsd:string)
dc:title Power-Aware Test Planning in the Early System-on-Chip Design Exploration Process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 55 (xsd:string)