A Characterization of t/s-Diagnosability an Sequential t-Diagnosability in Designs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/LeeB90
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dcterms:
bibliographicCitation
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http://dblp.uni-trier.de/rec/bibtex/journals/tc/LeeB90
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Jon_T._Butler
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https://dblp.l3s.de/d2r/resource/authors/Joo-Kang_Lee
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http://dx.doi.org/doi.org%2F10.1109%2F12.59861
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DBLP journals/tc/LeeB90
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DOI doi.org%2F10.1109%2F12.59861
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dcterms:
issued
1990
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journal
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rdfs:
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A Characterization of t/s-Diagnosability an Sequential t-Diagnosability in Designs.
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https://dblp.l3s.de/d2r/resource/authors/Jon_T._Butler
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10
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swrc:
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1298-1304
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dc:
subject
t/s-diagnosability; sequential t-diagnosability; designs; multiprocessing system; faulty processors; characterization theorem; diagnosability; sufficient condition; single-loop system; nodes; fault tolerant computing; multiprocessing systems.
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A Characterization of t/s-Diagnosability an Sequential t-Diagnosability in Designs.
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39
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