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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/Lo02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jien-Chung_Lo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.990124>
foaf:homepage <https://doi.org/10.1109/12.990124>
dc:identifier DBLP journals/tc/Lo02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.990124 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Analysis of a BICS-Only Concurrent Error Detection Method. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jien-Chung_Lo>
swrc:number 3 (xsd:string)
swrc:pages 241-253 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/Lo02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/Lo02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc51.html#Lo02>
rdfs:seeAlso <https://doi.org/10.1109/12.990124>
dc:subject built-in current sensors, concurrent error detection, fault coverage, operating speed, reliability, testability, unsafe probability (xsd:string)
dc:title Analysis of a BICS-Only Concurrent Error Detection Method. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)