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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/LoT90>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jien-Chung_Lo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suchai_Thanawastien>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.48869>
foaf:homepage <https://doi.org/10.1109/12.48869>
dc:identifier DBLP journals/tc/LoT90 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.48869 (xsd:string)
dcterms:issued 1990 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label On the Design of Combinational Totally Self-Checking I-out-of3 Code Checkers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jien-Chung_Lo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Suchai_Thanawastien>
swrc:number 3 (xsd:string)
swrc:pages 387-393 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/LoT90/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/LoT90>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc39.html#LoT90>
rdfs:seeAlso <https://doi.org/10.1109/12.48869>
dc:subject combinational totally self-checking 1-out-of-3 code checkers; NMOS; TSC goal; fault sequences; minimum fault sequences; automatic testing; integrated logic circuits; logic design; logic testing; MOS integrated circuits. (xsd:string)
dc:title On the Design of Combinational Totally Self-Checking I-out-of3 Code Checkers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)