Automatic Test Pattern Generation with Branch Testing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/MakkiBT91
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Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/MakkiBT91
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chen_Tianshang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Silvio_Bou-Ghazale
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F12.90257
>
foaf:
homepage
<
https://doi.org/10.1109/12.90257
>
dc:
identifier
DBLP journals/tc/MakkiBT91
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F12.90257
(xsd:string)
dcterms:
issued
1991
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tc
>
rdfs:
label
Automatic Test Pattern Generation with Branch Testing.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chen_Tianshang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Silvio_Bou-Ghazale
>
swrc:
number
6
(xsd:string)
swrc:
pages
785-791
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tc/MakkiBT91/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tc/MakkiBT91
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tc/tc40.html#MakkiBT91
>
rdfs:
seeAlso
<
https://doi.org/10.1109/12.90257
>
dc:
subject
branch testing; test algorithm; finite state machines; design-for-test; gate-level input/output lines; stuck-at faults; scan paths; simulation; automatic testing; fault location; logic testing.
(xsd:string)
dc:
title
Automatic Test Pattern Generation with Branch Testing.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
40
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