Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/MangirA82
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/MangirA82
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Algirdas_Avizienis
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/T%E2%88%9A%C4%BElin_Erdim_Mangir
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTC.1982.1676058
>
foaf:
homepage
<
https://doi.org/10.1109/TC.1982.1676058
>
dc:
identifier
DBLP journals/tc/MangirA82
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTC.1982.1676058
(xsd:string)
dcterms:
issued
1982
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tc
>
rdfs:
label
Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Algirdas_Avizienis
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/T%E2%88%9A%C4%BElin_Erdim_Mangir
>
swrc:
number
7
(xsd:string)
swrc:
pages
609-616
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tc/MangirA82/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tc/MangirA82
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tc/tc31.html#MangirA82
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TC.1982.1676058
>
dc:
subject
VLSI fault tolerance, Interconnect area estimates, redundancy partitioning, redundancy placement, regular designs, VLSI yield improvement
(xsd:string)
dc:
title
Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
31
(xsd:string)