Anomaly Detection in Embedded Systems.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/MaxionT02
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/MaxionT02
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dc:
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<
https://dblp.l3s.de/d2r/resource/authors/Kymie_M._C._Tan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Roy_A._Maxion
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foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F12.980003
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foaf:
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https://doi.org/10.1109/12.980003
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dc:
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DBLP journals/tc/MaxionT02
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dc:
identifier
DOI doi.org%2F10.1109%2F12.980003
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dcterms:
issued
2002
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swrc:
journal
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https://dblp.l3s.de/d2r/resource/journals/tc
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rdfs:
label
Anomaly Detection in Embedded Systems.
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foaf:
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<
https://dblp.l3s.de/d2r/resource/authors/Kymie_M._C._Tan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Roy_A._Maxion
>
swrc:
number
2
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swrc:
pages
108-120
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owl:
sameAs
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http://bibsonomy.org/uri/bibtexkey/journals/tc/MaxionT02/dblp
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owl:
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http://dblp.rkbexplorer.com/id/journals/tc/MaxionT02
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rdfs:
seeAlso
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http://dblp.uni-trier.de/db/journals/tc/tc51.html#MaxionT02
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rdfs:
seeAlso
<
https://doi.org/10.1109/12.980003
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dc:
subject
Anomaly, anomaly detection, coverage, dependability.
(xsd:string)
dc:
title
Anomaly Detection in Embedded Systems.
(xsd:string)
dc:
type
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swrc:Article
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foaf:Document
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51
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