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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/MazumderP89>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pinaki_Mazumder>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.21126>
foaf:homepage <https://doi.org/10.1109/12.21126>
dc:identifier DBLP journals/tc/MazumderP89 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.21126 (xsd:string)
dcterms:issued 1989 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pinaki_Mazumder>
swrc:number 3 (xsd:string)
swrc:pages 394-407 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/MazumderP89/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/MazumderP89>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc38.html#MazumderP89>
rdfs:seeAlso <https://doi.org/10.1109/12.21126>
dc:subject parallel testing; pattern-sensitive faults; semiconductor random-access memories; design strategy; MOS; design-for-testability approach; reliability; linear complexity; integrated circuit testing; integrated memory circuits; MOS integrated circuits; random-access storage. (xsd:string)
dc:title Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 38 (xsd:string)